Name:
ISO/TS 25138:2010 PDF
Published Date:
12/01/2010
Status:
Active
Publisher:
International Organization for Standardization (Technical Standard)
ISO/TS 25138:2010 describes a glow-discharge optical-emission spectrometric method for the determination of the thickness, mass per unit area and chemical composition of metal oxide films.
The method is applicable to oxide films 1 nm to 10 000 nm thick on metals. The metallic elements of the oxide can include one or more from Fe, Cr, Ni, Cu, Ti, Si, Mo, Zn, Mg, Mn and Al. Other elements that can be determined by the method are O, C, N, H, P and S.
| File Size : | 1 file , 600 KB |
| Note : | This product is unavailable in Russia, Ukraine, Belarus |
| Published : | 12/01/2010 |
| Same As : | ISO/TS 25138:2010 |
